Revealing New Atomic-scale Information about Materials by Improving the Quality and Quantifiability of Aberration-corrected STEM Data

Recent advances in aberration-corrected scanning transmission electron microscopy (AC-STEM) have shown the world previously unattainable views into the atomic structure and composition of materials. Thanks to improved optics, experimental and environmental factors often limit the quality of information accessed by AC-STEM. However, collecting and processing AC-STEM data using new techniques from data science can help overcome these limitations, opening the door to new atomic-scale materials information by improving our ability to determine atomic column positions, measure 3D structures, detect single point defects, and determine the atomic-scale composition of materials.